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XY automatic stage - List of Manufacturers, Suppliers, Companies and Products

XY automatic stage Product List

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Microscope XY Automatic Stage 【Improvement Case: Reducing the Burden of Repetitive Tasks】

Microscope XY Automatic Stage 【Improvement Case: Reducing the Burden of Repetitive Tasks】

Microscope XY Automatic Stage 【Improvement Case: Reducing the Effort of Repetitive Tasks】

【Issues】 When saving images of the entire workpiece, it was necessary to repeatedly perform "save image → move to adjacent view area → save image → ..." which was time-consuming and labor-intensive. 【Improvement Proposal】 By linking a CCD camera that saves images with an XY stage through a capture trigger signal, images of the entire workpiece can be automatically acquired. An I/O control program for image acquisition can also be easily created. This will free us from labor-intensive tasks and improve productivity. (The CCD camera will need to have an image saving function.)

  • Optical microscope
  • Other FA equipment
  • Other microscopes

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XY Automatic Stage for Microscopes 【Improvement Case: Upgrading Existing Microscopes】

XY Automatic Stage for Microscopes 【Improvement Case: Upgrading Existing Microscopes】

I want to create an appearance inspection system using the current microscope.

**[Needs]** Currently, we are using a microscope for visual inspection of appearance, but we want to build a system to improve the working environment of operators and inspection efficiency. **[Improvement Example]** The mapping software TeleMatri can manage the position of the stage and the input of pass/fail judgment results on the map, which can improve inspection efficiency. We can also provide only the controller (including software), allowing for combinations with XY stages from other manufacturers or custom-made ones. This increases the flexibility of system design and reduces the effort required for software development.

  • Optical Measuring Instruments
  • Other FA equipment
  • Other microscopes

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Microscope XY Automatic Stage 【Improvement Case: Observation of Large Workpieces】

Microscope XY Automatic Stage 【Improvement Case: Observation of Large Workpieces】

I want to observe a large work with a microscope.

【Issues】 The standard stage that comes with the microscope is too small, making it impossible to observe large workpieces. We were wasting time cutting the workpieces down to size or preparing them for observation. 【Improvement Example】 We have prepared a gantry-style XY stage (with a travel range of 200mm). By fixing the microscope on the X-axis and setting the workpiece on the Y-axis, you can observe the entire workpiece. Please consult us regarding the stage's travel range.

  • Optical microscope
  • Other FA equipment
  • Other microscopes

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Microscope XY Automatic Stage 【Improvement Case: Parts Printing】

Microscope XY Automatic Stage 【Improvement Case: Parts Printing】

I want to mark the parts arranged on the pallet using a marker or printer.

**[Needs]** We are developing a program to link the marker printer and the XY stage using a sequencer, but due to the small-batch production of various types, we frequently have to change the program when the types of parts change. **[Improvement Example]** We link the marker printer and the XY stage to mark each part. We can easily create I/O control programs for the marker printer's marking start output and end input. Even if the inspection target changes, we can respond immediately by simply changing the map shape.

  • Optical microscope
  • Other FA equipment
  • Other microscopes

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Microscope XY Automatic Stage 【Case Study: Integration with Measuring Instruments】

Microscope XY Automatic Stage 【Case Study: Integration with Measuring Instruments】

I want to link various measuring devices with an XY stage to perform measurements of the entire workpiece.

**[Needs]** I want to obtain data for the entire workpiece using measuring instruments such as spectrometers, film thickness gauges, contact angle meters, and laser displacement meters. **[Improvement Example]** By linking various measuring instruments with an XY stage, automatic measurement of the entire workpiece will be performed. It is also easy to create I/O control programs for the measurement start output and end input of the measuring instruments. Even if the measurement target or measurement pitch changes, it can be quickly accommodated by simply changing the map shape. (The function for acquiring and saving measurement data will be required on the measuring instrument side.)

  • Optical microscope
  • Inspection fixture
  • Other microscopes

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Microscope XY Automatic Stage 【Improvement Case: Losing Track of Inspection Areas】

Microscope XY Automatic Stage 【Improvement Case: Losing Track of Inspection Areas】

I can't tell which element I'm looking at under the microscope right now...

【Issues】 When inspecting elements such as wafers and electronic components arranged in an orderly manner under a microscope, it is often the case that even if a defective area is found, it becomes unclear which element it is. 【Improvement Example】 The mapping software TeleMatri allows for the management of the stage's position on the map, eliminating the possibility of making mistakes about the current inspection location. By color-marking defective areas on the map and later outputting a report, the results can be accurately recorded, thereby improving work efficiency.

  • Optical microscope
  • Other FA equipment
  • Image Processing Equipment

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XY Automatic Stage for Microscopes 【Improvement Case: Integration with Image Processing Equipment】

XY Automatic Stage for Microscopes 【Improvement Case: Integration with Image Processing Equipment】

I want to inspect the parts arranged on the pallet for quality judgment using an image processing device.

【Background】 We were conducting inspections by programming the image processing device with a sequencer. Due to the production of various small quantities, we frequently had to change the program. 【Improvement Example】 We linked the image processing device with the XY stage to color mark defective areas on the map. It is also easy to create I/O control programs for the processing start output and pass/fail judgment input of the image processing device. Even if the inspection target changes, we can respond immediately by simply changing the map shape.

  • Other FA equipment
  • Image Processing Equipment
  • Other microscopes

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